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邀请:LabVIEW+AI|ADC/PMIC/MCE/DAQ芯片测试技术研讨会(厦门站 2026.1.21)
NI测试测量技术研讨会再次由深圳起航,以AI+测试为主题,走遍十个城市,与全国各地朋友相聚,共同探讨AI+测试的落地,共赢智能测试的未来。 多通道、大电流电源管理芯片(PMIC)测试系统 ...
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