As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

AI is becoming more than a talking point for chip and system design, taking on increasingly complex tasks that are now competitive requirements in many markets. But the inclusion of AI, along with its ...

Nearly all designs at advanced process nodes need some sort of power-saving strategy. As more designs employ advanced low-power techniques, design teams are discovering huge implementation hurdles ...