The variety of different test methodologies combined with today�s mixture of memory devices creates a complex test profile. The manufacturing test floor hums with activity; a range of memory devices ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...

Having explained in part 1 the nature of the memory test challenge in the industry today, this article discusses non-intrusive debug and test methods based on embedded instruments and how these ...

Microprocessor testing and self-test techniques constitute a critical domain in ensuring the reliability and performance of modern computing devices. These methodologies encompass both hardware and ...