Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

Until the mid-1970s, compression testing of composite materials received relatively little attention. Up to that point it, had generally been assumed that the compressive stiffness was approximately ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Innovative compression algorithms can improve today�s high-speed data sampling. Compression algorithms have enabled many popular applications over the years. We cannot imagine sending e-mail ...