Researchers at the California NanoSystems Institute at UCLA published a step-by-step framework for determining the ...

Researchers from the Institute of Metal Research (IMR) of the Chinese Academy of Sciences have stretched a chain of gold ...

Atomic force microscopy (AFM) has evolved into an indispensable tool for nanoscale investigation, enabling detailed imaging and quantification of surface topography as well as mechanical properties.

Inserting, removing or swapping individual atoms from the core of a molecule is a long-standing challenge in chemistry. This ...

New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...

By combining atomic force microscopy (AFM) with a Hadamard productbased image reconstruction algorithm, scientists ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...

Anyone who has ever taken the time to critically examine a walnut knows that a two-dimensional photograph fails in many respects to truly convey the unique features--the nicks, crannies, valleys, and ...

Scientists at Lawrence Berkeley National Laboratory made a big leap in their research into all things small. Within the past few months, scientists there began using what they say is the world’s most ...